The IASTED International
Conference
on
Nanotechnology and Applications
~NANA 2008~
September 29 – October 1, 2008
Crete, Greece
SPECIAL SESSION
Advancements and Applications of Scanning Probe Microscopy Techniques
Abstract
The session is a platform presenting progress achieved in Scanning Tunnelling Microscopy and Atomic Force Microscopy imaging and spectroscopy tools applied for the characterization of nano-structured surfaces. Topics include the electronic and structural characterization of organic and inorganic nanostructures (including implications on site-selective interactions with adsorbates) and the investigation of adsorbate-induced local substrate modifications.
Biography of the Presenter
Dr. Pascal Ruffieux has long-standing experience in characterising adsorbates and local adsorbate-induced modifications of the surface's electronic properties by Scanning Tunnelling Microscopy and Atomic Force Microscopy. He currently investigates the site-selectivity of molecular adsorbates on laterally inhomogeneous nano-scaled template surfaces such as vicinal surfaces or strain-relief patterns and modifications of the local electronic properties of carbon nanostructures upon adsorption of various atomic species. The session organiser is currently employed as project leader at the Swiss Federal Laboratories for Materials Testing and Research (EMPA).
Please email all submisssions to pascal.ruffieux@empa.ch by June 1, 2008.
Important Deadlines
| Submissions due | June 1, 2008 |
| Notification of acceptance | July 1, 2008 |
| Final manuscripts due | August 10, 2008 |
| Registration deadline | August 15, 2008 |
